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MARCH 2019 FEATURE ARTICLES - THESE ARE OPEN ACCESS FOR A LIMITED TIME

Computed Laminography of CFRP Using an X-Ray Cone-Beam and Robotic Sample Manipulator Systems

by Charles E. Wood, Neil O'Brien, Andriy Denysov, and Thomas Blumensath


Carbon fiber-reinforced polymers (CFRPs) are of interest to the aerospace sector for meeting future CO 2 emission targets due to their weight reduction potential. However, the detection of structural and matrix defects is crucial for determining the performance and suitability of CFRPs in current and future generations of aircraft. Computed laminography (CL), a well-established nondestructive testing method, is well suited to the scanning of CFRP components with large aspect ratios, for which the conventional computed tomography (CT) is less suitable. Utilizing an existing Nikon Metrology custom build X-ray CT scanner, two lift-in lift-out robotic sample manipulator systems are used to extend the capability of the system and allow the exploration of atypical scanning geometries. more...
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Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

by Alexandre Le Roch, Cédric Virmontois, Philippe Paillet, Jean-Marc Belloir, Serena Rizzolo, Federico Pace, Clémentine Durnez, Pierre Magnan, and Vincent Goiffon

This paper investigates the leakage currents as well as the leakage current Random Telegraph Signals (RTSs) sources in sense node floating diffusions (FDs) and their consequences on imaging performances specifically after exposure to high-energy particle radiation. Atomic displacement damage and ionization effects are separately studied thanks to neutron and X-ray irradiations. Proton irradiations have been performed to simultaneously study displacement damage dose (DDD) and total ionizing dose (TID) effects while being more representative of the space environment. The studied DDD ranges from 500TeV⋅g−1 to 40GeV⋅g−1, and the TID ranges from 24 krad(SiO2) to 72 krad(SiO2). High-magnitude electric field effects, such as transfer-gate-induced leakage current, are investigated to further understand the phenomena involved in FDs while giving new insights into the Electric Field Enhancement of the charge generation mechanisms. more...
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Active Feedback With Leakage Current Compensation for Charge Sensitive Amplifier Used in Hybrid Pixel Detector

by P. Kmon, G. Deptuch, F. Fahim, P. Grybos, P. Maj, R. Szczygiel, and T. Zimmerman

We report on the design of an active feedback circuit for charge sensitive amplifiers used for reading out hybrid pixel detectors. The predominant advantages of the proposed feedback over the existing solutions are its low noise, stability, and tunability. In addition, the circuit occupies small silicon area, which is crucial for hybrid pixel detectors. This paper presents both the mathematical analysis of the proposed circuit and measurement results obtained with the test structure. more...
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A PUBLICATION OF THE IEEE NUCLEAR AND PLASMA SCIENCES SOCIETY
MARCH 2019  |  VOLUME 66  |  NUMBER 3  |  IETNAE  |  (SSN 0018-9499)

REGULAR PAPERS
ACCELERATOR TECHNOLOGY
Study on the Effect of Laser Parameters on the SEY of Aluminum Alloy . . .. . . . . . . . . . . . . . . . . J. Wang, Y. Gao, J. Fan, Z. You, S. Wang, and Z. Xu

RADIATION EFFECTS
Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Le Roch, C. Virmontois, P. Paillet, J.-M. Belloir, S. Rizzolo, F. Pace, C. Durnez, P. Magnan, and V. Goiffon
An Analytical Study of the Effect of Total Ionizing Dose on Body Current in 130-nm PDSOI I/O nMOSFETs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . X. Xie, H. Zhu, M. Zhang, X. Liu, L. Dai, D. Bi, Z. Hu, Z. Zhang, and S. Zou
A Bias-Dependent Single-Event-Enabled Compact Model for Bulk FinFET Technologies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. S. Kauppila, D. R. Ball, J. A. Maharrey, R. C. Harrington, T. D. Haeffner, A. L. Sternberg, M. L. Alles, and L. W. Massengill
On the Susceptibility of SRAM-Based FPGA Routing Network to Delay Changes Induced by Ionizing Radiation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Darvishi, Y. Audet, Y. Blaquière, C. Thibeault, and S. Pichette

RADIATION INSTRUMENTATION
Computed Laminography of CFRP Using an X-Ray Cone-Beam and Robotic Sample Manipulator Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. E. Wood, N. O’Brien, A. Denysov, and T. Blumensath
Active Feedback With Leakage Current Compensation for Charge Sensitive Amplifier Used in Hybrid Pixel Detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P. Kmon, G. Deptuch, F. Fahim, P. Grybos, P. Maj, R. Szczygiel, and T. Zimmerman
Method to Extract System-Independent Material Properties From Dual-Energy X-Ray CT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. M. Champley, S. G. Azevedo, I.M. Seetho, S.M. Glenn, L. D. McMichael, J. A. Smith, J. S. Kallman, W. D. Brown, and H. E. Martz, Jr.
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