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JANUARY 2019 FEATURE ARTICLES - THESE ARE OPEN ACCESS FOR A LIMITED TIME
A Brief History of Space Climatology: From the Big Bang to the Presents by Michael Xapsos Review of space climatology is presented with a view toward spacecraft electronics applications. The origins and abundances of space radiations are discussed and related to their potential effects. Significant historical developments are summarized leading to the inception of space climatology and into the space era. Energetic particle radiation properties and models of galactic cosmic rays, solar energetic and geomagnetic trapped particles are described. This includes current radiation effects issues that models face today. more...

Directional Dependence of Co-60 Irradiation on the Total Dose Response of Flash Memories by Matthew J. Gadlage, David I. Bruce, James D. Ingalls, Dobrin P. Bossev, Matthew McKinney, and Matthew J. Kay The amount of data corruption in a wide assortment of flash memories observed during Co-60 total dose tests is shown to have a strong dependence on the direction in which the Co-60 irradiation is performed. The effect is due to dose enhancement from the metal layers above the floating gate. The dose enhancement effect is shown to become greater as technology node scales and is even observed in on a state-of-the-art 3-D NAND flash memory. The radiation hardness assurance implications of this dose enhancement effect are significant and are discussed in detail. more...

Optimizing Optical Parameters to Facilitate Correlation of Laser- and Heavy-Ion-Induced Single-Event Transients in SiGe HBTs by Adrian Ildefonso, Zachary E. Fleetwood, George N. Tzintzarov, Joel M. Hales, Delgermaa Nergui, Milad Frounchi, Ani Khachatrian, Stephen P. Buchner, Dale McMorrow, Jeffrey H. Warner, Joseph Harms, Anna Erickson, Kay Voss, Véronique Ferlet-Cavrois, and John D. Cressle An approach for determining the optimal laser parameters (i.e., pulse energy, focused spot size, wavelength, and pulse duration) for correlating single-event transients induced via two-photon absorption (TPA) and heavy ions is presented. The approach focuses on identification and extraction of waveform characteristics, or “features,” and minimizing the error between features produced by TPA and ions. Modifying optical parameters can directly impact the waveform features of the TPA-induced transients. Consequently, optimal laser parameters that minimize the error between features extracted for laser- and ion-induced waveforms can be determined. In this paper, the laser pulse energy and spot size were varied, while maintaining a fixed pulse duration and wavelength, and the resulting transients were compared to ion-induced transients. When the optimized optical parameters are used, excellent agreement was achieved between laser- and ion-induced transient waveforms in a silicon-germanium heterojunction bipolar transistor (SiGe HBT). In addition, a one-to-one correlation between heavy-ion linear energy transfer (LET) and laser pulse energy was obtained for a particular spot size ( ω0=1.89μm (HW 1/e2 )). These results show that a correlation between LET and pulse energy is achievable when the remaining optical parameters are selected appropriately. Although the results presented are for SiGe HBTs, the generality of the approach should allow it to be extended to other semiconductor platforms. more...

Compact and Effective Detector of the Fast Neutrons on a Base of Ce-doped Gd₃Al₂Ga₃O₁₂ Scintillation Crystal by Mikhail Korjik, Kai-Thomas Brinkmann, Georgy Dosovitskiy, Valery Dormenev, Andrei Fedorov, Dmitry Kozlov, Vitaly Mechinsky, and Hans-Georg Zaunick Gadolinium aluminum gallium garnet Gd₃ Al₂ Ga₃ O₁₂: Ce crystal is demonstrated to be an excellent scintillation material for detection of fast neutrons for the first time. This is achieved because the material, first, has high content of Gd, which absorbs neutrons with following prompt emission of γ -quanta, and, second, detects this radiation efficiently thanks to high stopping power and high scintillation light yield. GEANT4 modeling was used to distinguish several characteristic regions in γ -quanta pulse height spectra acquired with GAGG:Ce crystal under neutron irradiation, with energies nearly 90 and 190, and 511 keV, which have different relative intensities depending on incident neutrons kinetic energy. This was approved by measurements on Am–Be neutron source. Sensitivity of the material to neutrons from Am–Be source was compared to 6 Li-based glass, and found to be superior, depending on signal selectivity. more...


A PUBLICATION OF THE IEEE NUCLEAR AND PLASMA SCIENCES SOCIETY
JANUARY 2019 \| VOLUME 66 \| NUMBER 1 \| IETNAE \| (SSN 0018-9499)
NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) Kona, HI, USA, July 16–20, 2018
EDITORIAL Conference Comments by the General Chair. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . R. Lacoe Special NSREC 2018 Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE Comments by the Editors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. M. Fleetwood, D. Brown, H. Quinn, I. Sanchez Esqueda, W. Robinson, S. Moss, V. Goiffon, and P. Paillet LIST OF REVIEWERS NSREC 2018 Special Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE List of Reviewers AWARDS 2018 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman . . . . . . . . . . . . . . . . . . . . . . . . . S. P. Buchner Outstanding Conference Paper Award: 2018 IEEE Nuclear and Space Radiation Effects Conference IN MEMORIAM Wendland Beezhold INVITED REVIEW A Brief History of Space Climatology: From the Big Bang to the Present . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Xapsos RADIAITON EFFECTS IN DEVICES AND INTEGRATED CIRCUITS Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C.-M. Zhang, F. Jazaeri, G. Borghello, F. Faccio, S. Mattiazzo, A. Baschirotto, and C. Enz Total Ionizing Dose Effects in 3-D NAND Flash Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Bagatin, S. Gerardin, A. Paccagnella, S. Beltrami, A. Costantino, M. Muschitiello, A. Zadeh, and V. Ferlet-Cavrois Training a Neural Network on Analog TaO_x ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . R. B. Jacobs-Gedrim, D. R. Hughart, S. Agarwal, G. Vizkelethy, E. S. Bielejec, B. L. Vaandrager, S. E. Swanson, K. E. Knisely, J. L. Taggart, H. J. Barnaby, and M. J. Marinella Ionizing Radiation Effects Spectroscopy for Analysis of Total-Ionizing Dose Degradation in RF Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. Patel, M. Joplin, R. C. Boggs, D. R. Reising, M. W. McCurdy, L. W. Massengill, and T. D. Loveless Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. L. Taggart, R. B. Jacobs-Gedrim, M. L. McLain, H. J. Barnaby, E. S. Bielejec, W. Hardy, M. J. Marinella, M. N. Kozicki, and K. Holbert Effects of Gamma Irradiation on Magnetic Properties of Double-Interface CoFeB/MgO Multifilms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. Wang, Z. Wang, K. Cao, X. Bi, Y. Zhao, Y. Zhang, and W. Zhao Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S. Bonaldo, S. Mattiazzo, C. Enz, A. Baschirotto, A. Paccagnella, X. Jin, and S. Gerardin Effect of Proton Radiation on Ultrawide Bandgap AlN Schottky Barrier Diodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. Montes, T.-H. Yang, H. Fu, H. Chen, X. Huang, K. Fu, I. Baranowski, and Y. Zhao Evaluation of Radiation Effects in RRAM-Based Neuromorphic Computing System for Inference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Z. Ye, R. Liu, J. L. Taggart, H. J. Barnaby, and S. Yu PHOTONIC DEVICES AND INTEGRATED CIRCUITS Dose and Single-Event Effects on a Color CMOS Camera for Space Exploration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. Virmontois, J.-M. Belloir, M. Beaumel, A. Vriet, N. Perrot, C. Sellier, J. Bezine, D. Gambart, D. Blain, E. Garcia-Sanchez, W. Mouallem, and A. Bardoux Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S. Rizzolo, V. Goiffon, F. Corbière, R. Molina, A. Chabane, S. Girard, P. Paillet, P. Magnan, A. Boukenter, T. Allanche, C. Muller, C. Monsanglant-Louvet, M. Osmond, H. Desjonquères, J.-R. Macé, P. Burnichon, J.-P. Baudu, and S. Plumeri Radiation-Induced Effects on Fiber Bragg Gratings Inscribed in Highly Birefringent Photonic Crystal Fiber . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Morana, T. Baghdasaryan, S. Girard, E. Marin, T. Geernaert, H. Thienpont, F. Berghmans, A. Boukenter, and Y. Ouerdane Total Ionizing Dose Effects in 70-GHz Bandwidth Photodiodes in a SiGe Integrated Photonics Platform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P. S. Goley, G. N. Tzintzarov, S. Zeinolabedinzadeh, A. Ildefonso, K. Motoki, R. Jiang, E. X. Zhang, D. M. Fleetwood, L. Zimmermann, M. Kaynak, S. Lischke, C. Mai, and J. D. Cressler Comparative Study of Cryogenic Versus Room-Temperature Proton Irradiation of N-Channel CCDs and Subsequent Annealing . . . . . . . . . . . . . . . . . . . . . . . T. Prod’homme, P. Verhoeve, F. Lemmel, H. Smit, S. Blommaert, C. van der Luijt, I. Visser, T. Beaufort, Y. Levillain, and B. Shortt RADIATION HARDNESS ASSURANCE The Effect of 1–10-MeV Neutrons on the JESD89 Test Standard . . . . . . . . . . . . . . . . . . . . . . . H. Quinn, A. Watkins, L. Dominik, and C. Slayman Directional Dependence of Co-60 Irradiation on the Total Dose Response of Flash Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. J. Gadlage, D. I. Bruce, J. D. Ingalls, D. P. Bossev, M. McKinney, and M. J. Kay Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage . . . . . . . . . . . . . . . . . . D. Kobayashi, N. Hayashi, K. Hirose, Y. Kakehashi, O. Kawasaki, T. Makino, T. Ohshima, D. Matsuura, Y. Mori, M. Kusano, T. Narita, S. Ishii, and K. Masukawa Total Dose Testing Methodology for Bipolar Circuits Operating in the Jovian Radiation Environment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P. C. Adell, S. McClure, B. R. Rax, D. Thorbourn, A. Kenna, I. Jun, W. Kim, and L. Scheick Dose-Rate Dependence of the Total-Ionizing-Dose Response of GaN-Based HEMTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . R. Jiang, E. X. Zhang, M. W. McCurdy, P. Wang, H. Gong, D. Yan, R. D. Schrimpf, and D. M. Fleetwood Impacts of Proton Radiation on Heavy-Ion-Induced Single-Event Transients in 65-nm CMOS Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Z. Wu, S. Chen, J. Chen, and P. Huang Methodology for Identifying Radiation Effects in Robotic Systems With Mechanical and Control Performance Variations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. T. Howard, E. J. Barth, R. D. Schrimpf, R. A. Reed, L. C. Adams, D. Vibbert, and A. F. Witulski Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Privat, H. J. Barnaby, P. C. Adell, B. S. Tolleson, Y. Wang, X. Han, P. Davis, B. R. Rax, and T. E. Buchheit Temperature-Switching During Irradiation as a Test for ELDRS in Linear Bipolar Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . X. Li, W. Lu, Q. Guo, D. M. Fleetwood, C. He, X. Wang, X. Yu, J. Sun, M. Liu, and S. Yao RADIATION HARDENING BY DESIGN Strategies for Removing Common Mode Failures From TMR Designs Deployed on SRAM FPGAs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. J. Cannon, A. M. Keller, H. C. Rowberry, C. A. Thurlow, A. Pérez-Celis, and M. J. Wirthlin Selective Hardening for Neural Networks in FPGAs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . F. Libano, B. Wilson, J. Anderson, M. J. Wirthlin, C. Cazzaniga, C. Frost, and P. Rech Microcontroller Compiler-Assisted Software Fault Tolerance . . . . . . . . . . . . . . . . M. Bohman, B. James, M. J. Wirthlin, H. Quinn, and J. Goeders Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. D. Black, J. A. Dame, D. A. Black, P. E. Dodd, M. R. Shaneyfelt, J. Teifel, J. G. Salas, R. Steinbach, M. Davis, R. A. Reed, R. A. Weller, J. M. Trippe, K. M. Warren, A. M. Tonigan, R. D. Schrimpf, and R. S. Marquez Best Practices for Using Electrostatic Discharge Protection Techniques for Single-Event Transient Mitigation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M.-K. Cho, I. Song, Z. E. Fleetwood, A. Khachatrian, J. H. Warner, S. P. Buchner, D. McMorrow, P. Paki, and J. D. Cressler Evaluating the Impact of Repetition, Redundancy, Scrubbing, and Partitioning on 28-nm FPGA Reliability Through Neutron Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . O. O. Kibar, P. Mohan, P. Rech, and K. Mai SPACE AND TERRESTRIAL RADIATION ENVIRONMENTS Using the Galileo Solid-State Imaging Instrument as a Sensor of Jovian Energetic Electrons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Carlton, M. de Soria-Santacruz Pich, W. Kim, I. Jun, and K. Cahoy Experimental Evidence of Ground Albedo Neutron Impact on Soft Error Rate for Nanoscale Devices . . . . . . . . . . . . . . . . G. Hubert and L. Artola Correlation of Single-Board Computer Ground-Test Data and On-Orbit Upset Rates From the Gaia Mission . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. L. Hansen, E. Ecale, R. Hillman, F. Meraz, J. Montoya, P. Paulet, E. Serpell, P. Tatry, and G. Williamson DOSIMETR SRAM Dosimeter for Characterizing the TRIUMF Proton and Neutron Beams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E. Blackmore, M. Trinczek, K. Jiang, M. Sachdev, and D. Wright An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18-μm CMOS Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. Prinzie, S. Thys, B. Van Bockel, J. Wang, V. De Smedt, and P. Leroux A Low-Power, Real-Time Displacement Damage Dosimeter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. H. Warner, R. Hoheisel, C. D. Cress, P. P. Jenkins, J. R. Lorentzen, D. A. Scheiman, and M. K. Yakes Dosimetry Mapping of Mixed-Field Radiation Environment Through Combined Distributed Optical Fiber Sensing and FLUKA Simulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. Di Francesca, A. Infantino, G. Li Vecchi, S. Girard, A. Alessi, Y. Kadi, and M. Brugger X-Rays, γ -Rays, and Proton Beam Monitoring With Multimode Nitrogen-Doped Optical Fiber . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S. Girard, D. Di Francesca, A. Morana, C. Hoehr, P. Paillet, C. Duzenli, N. Kerboub, I. Reghioua, G. Li Vecchi, A. Alessi, O. Duhamel, M. Trinczek, E. Marin, A. Boukenter, Y. Ouerdane, J. Mekki, R. G. Alía, Y. Kadi, and M. Brugger TID Evaluation System With On-Chip Electron Source and Programmable Sensing Mechanisms on FPGA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . G. Lentaris, K. Maragos, D. Soudris, F. Di Capua, L. Campajola, M. Campajola, A. Costantino, G. Furano, A. Tavoularis, and L. Santos SOI Thin Microdosimeter Detectors for Low-Energy Ions and Radiation Damage Studies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. James, L. T. Tran, J. Vohradsky, D. Bolst, V. Pan, M. Carr, S. Guatelli, A. Pogossov, M. Petasecca, M. Lerch, D. A. Prokopovich, M. I. Reinhard, M. Povoli, A. Kok, D. Hinde, M. Dasgupta, A. Stuchbery, V. Perevertaylo, and A. B. Rosenfeld Uncertainty Characterization of Silicon Damage Metrics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P. J. Griffin SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. R. Ball, B. D. Sierawski, K. F. Galloway, R. A. Johnson, M. L. Alles, A. L. Sternberg, A. F. Witulski, R. A. Reed, R. D. Schrimpf, A. Javanainen, and J.-M. Lauenstein Radiation Response of AlGaN-Channel HEMTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. J. Martinez, M. P. King, A. G. Baca, A. A. Allerman, A. A. Armstrong, B. A. Klein, E. A. Douglas, R. J. Kaplar, and S. E. Swanson SINGLE-EVENT EFFECTS: TRANSIENT CHARACTERIZATION SET Sensitivity of Trigate Silicon Nanowire Field-Effect Transistors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Raine, M. Gaillardin, M. Martinez, O. Duhamel, J. Riffaud, T. Lagutere, C. Marcandella, P. Paillet, N. Richard, M. Vinet, F. Andrieu, and S. Barraud Optimizing Optical Parameters to Facilitate Correlation of Laser- and Heavy-Ion-Induced Single-Event Transients in SiGe HBTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Ildefonso, Z. E. Fleetwood, G. N. Tzintzarov, J. M. Hales, D. Nergui, M. Frounchi, A. Khachatrian, S. P. Buchner, D. McMorrow, J. H. Warner, J. Harms, A. Erickson, K. Voss, V. Ferlet-Cavrois, and J. D. Cressler Investigation of Single-Event Transients in AlGaN/GaN MIS-Gate HEMTs Using a Focused X-Ray Beam . . . . . . A. Khachatrian, N. J.-H. Roche, S. P. Buchner, A. D. Koehler, T. J. Anderson, D. McMorrow, S. D. LaLumondiere, J. P. Bonsall, E. C. Dillingham, and D. L. Brewe Pulsed-Laser Induced Single-Event Transients in InGaAs FinFETs on Bulk Silicon Substrates . . . . . . . . . . . . . . . . . . . . . . . . . . . . H. Gong, K. Ni, E. X. Zhang, A. L. Sternberg, J. A. Kozub, M. L. Alles, R. A. Reed, D. M. Fleetwood, R. D. Schrimpf, N. Waldron, B. Kunert, and D. Linten Laser-Induced Single-Event Transients in Black Phosphorus MOSFETs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. Liang, R. Ma, K. Li, Y. Su, H. Gong, K. L. Ryder, P. Wang, A. L. Sternberg, E. X. Zhang, M. L. Alles, R. A. Reed, S. J. Koester, D. M. Fleetwood, and R. D. Schrimpf The Effects of Temperature on the Single-Event Transient Response of a High-Voltage (>30 V) Complementary SiGe-on-SOI Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. P. Omprakash, A. Ildefonso, Z. E. Fleetwood, G. N. Tzintzarov, A. S. Cardoso, J. A. Babcock, R. Mukhopadhyay, A. Khachatrian, J. H. Warner, D. McMorrow, S. P. Buchner, and J. D. Cressler BASIC MECHANISMS OF RADIATION EFFECTS Dopant-Type and Concentration Dependence of Total-Ionizing-Dose Response in Piezoresistive Micromachined Cantilevers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. N. Arutt, P. D. Shuvra, J.-T. Lin, M. L. Alles, B. W. Alphenaar, J. L. Davidson, K. M. Walsh, S. McNamara, D. M. Fleetwood, and R. D. Schrimpf A Multifield and Frequency Electrically Detected Magnetic Resonance Study of Atomic-Scale Defects in Gamma Irradiated Modern MOS Integrated Circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. J. Myers, R. J. Waskiewicz, P. M. Lenahan, and C. D. Young Effects of Proton Radiation-Induced Defects on Optoelectronic Properties of MoS₂ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. Foran, C. Mann, M. Peterson, A. Bushmaker, B. Wang, J. Chen, S. Yang, and S. B. Cronin Total Ionizing Dose Effects and Proton-Induced Displacement Damage on MoS₂-Interlayer-MoS₂ Tunneling Junctions . . . . . . . . . . . . . P. Wang, C. J. Perini, A. O’Hara, H. Gong, P. Wang, E. X. Zhang, M. W. McCurdy, D. M. Fleetwood, R. D. Schrimpf, S. T. Pantelides, and E. M. Vogel A New Analytical Tool for the Study of Radiation Effects in 3-D Integrated Circuits: Near-Zero Field Magnetoresistance Spectroscopy . . . . . . . . . . . . . . . . . J. P. Ashton, S. J. Moxim, P. M. Lenahan, C. G. McKay, R. J. Waskiewicz, K. J. Myers, M. E. Flatté, N. J. Harmon, and C. D. Young SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING Mechanisms of Electron-Induced Single-Event Latchup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Tali, . . . . . . . . . . R. G. Alía, M. Brugger, V. Ferlet-Cavrois, R. Corsini, W. Farabolini, A. Javanainen, G. Santin, C. Boatella Polo, and A. Virtanen Understanding the Average Electron–Hole Pair-Creation Energy in Silicon and Germanium Based on Full-Band Monte Carlo Simulations . . . . . . . . . . . . . . . . . . . . . . J. Fang, M. Reaz, S. L. Weeden-Wright, R. D. Schrimpf, R. A. Reed, R. A. Weller, M. V. Fischetti, and S. T. Pantelides SEFI Modeling in Readout Integrated Circuit Induced by Heavy Ions at Cryogenic Temperatures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . L. Artola, S. Ducret, F. Advent, G. Hubert, and J. Mekki Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . R. G. Alía, P. F. Martínez, M. Kastriotou, M. Brugger, J. Bernhard, M. Cecchetto, F. Cerutti, N. Charitonidis, S. Danzeca, L. Gatignon, A. Gerbershagen, S. Gilardoni, N. Kerboub, M. Tali, V. Wyrwoll, V. Ferlet-Cavrois, C. Boatella Polo, H. Evans, G. Furano, and R. Gaillard Impact of the Elemental Makeup of an IC in Generating Single-Event Upsets From Low-Energy (<10 MeV) Neutrons: A 3-D NAND Flash Case Study . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P. M. Conway, M. J. Gadlage, J. D. Ingalls, A. M. Williams, D. I. Bruce, and D. P. Bossev Heavy Ion Transport Modeling for Single-Event Burnout in SiC-Based Power Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. A. McPherson, P. J. Kowal, G. K. Pandey, T. P. Chow, W. Ji, and A. A. Woodworth Conference Author Index PART II OF TWO PARTS REGULAR PAPERS RADIATION INSTRUMENTATION Effect of Gamma-Ray Energy on Image Quality in Passive Gamma Emission Tomography of Spent Nuclear Fuel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. Bélanger-Champagne, P. Peura, P. Eerola, T. Honkamaa, T. White, M. Mayorov, and P. Dendooven Improvement of a PET Detector Performance by Setting Reflectors in Parallel With PMT Face . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . N. Inadama, H. Murayama, F. Nishikido, J. Ohi, and T. Yamaya La- and La-/Ce-Doped BaF₂ Crystals for Future HEP Experiments at the Energy and Intensity Frontiers Part I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . F. Yang, J. Chen, L. Zhang, C. Hu, and R.-Y. Zhu La- and La-/Ce-Doped BaF₂ Crystals for Future HEP Experiments at the Energy and Intensity Frontiers Part II . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . F. Yang, J. Chen, L. Zhang, C. Hu, and R.-Y. Zhu On the Instantaneous Dose Rate and Angular Dependence of Monolithic Silicon Array Detectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . G. Biasi, N. Hardcastle, M. Petasecca, S. Guatelli, V. Perevertaylo, T. Kron, and A. B. Rosenfeld Model-Based Pileup Events Correction via Kalman-Filter Tunnels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. Liu, M. Liu, M. He, Y. Ma, and X. Tuo Compact and Effective Detector of the Fast Neutrons on a Base of Ce-doped Gd₃Al₂Ga₃O₁₂ Scintillation Crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Korjik, K.-T. Brinkmann, G. Dosovitskiy, V. Dormenev, A. Fedorov, D. Kozlov, V. Mechinsky, and H.-G. Zaunick
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