T-PS Header
T-NS Home  |   Editorial Board  |   T-NS in IEEE Xplore  |    Early Access  |   Manuscript Submission
APRIL 2018 FEATURE ARTICLES - THESE ARE OPEN ACCESS FOR A LIMITED TIME

Development of a Very Low-Noise Cryogenic Preamplifier for Large-Area SiPM Devices

by Marco D'Incecco, Cristiano Galbiati, Graham K. Giovanetti, George Korga, Xinran Li, Andrea Mandarano, Alessandro Razeto, Davide Sablone, and Claudio Savarese


Silicon photomultipliers (SiPMs) are an excellent candidate for the development of large-area light sensors. Large SiPM-based detectors require low-noise preamplifiers to maximize the signal coupling between the sensor and the read-out electronics. This paper reports on the development of a low-noise transimpedance amplifier sensitive to single-photon signals at cryogenic temperature. The amplifier is used to read-out a 1-cm2 SiPM with a signal-to-noise ratio in excess of 40. more...
 
-----------------------

Enhanced Scintillation Light Extraction Using Nanoimprinted Photonic Crystals

by Bipin Singh, Matthew S. J. Marshall, Shane Waterman, Carlos Pina-Hernandez, Alexander Koshelev, Keiko Munechika, Arno Knapitsch, Matteo Salomoni, Rosalinde Pots, Paul Lecoq, and Vivek V. Nagarkar


The extraction of scintillation light from a crystal with high efficiency and low time jitter is vital for realizing much-needed gains in the performance of numerous radiation detection and imaging instruments that are vital components in medical imaging, industrial, and homeland security applications for the detection, localization, and energy classification of X-rays, γ -rays, or neutrons. Nanostructures such as photonic crystals (PhCs) maximize extraction of usable scintillation light that is otherwise lost when a high refractive index (RI) scintillator is coupled to a photodetector with low RI window. The PhC gradually changes the RI between the scintillator and photodetector, thereby substantially improving the light extraction efficiency, as well as the energy resolution (ER) and timing resolution. Here, we report on improvements in the light extraction and ER of inorganic scintillators using PhCs nanoimprinted in high RI polymers. Details of the design, fabrication, and characterization of the PhCs, the high RI polymers, and their impact on scintillator performance are presented here. more...
 
-----------------------

A PUBLICATION OF THE IEEE NUCLEAR AND PLASMA SCIENCES SOCIETY

APRIL 2018   |  VOLUME 65  |  NUMBER 4  |  IETNAE  |  (SSN 0018-9499)

REGULAR PAPERS
ACCELERATOR TECHNOLOGY
The New Beam Diagnostic Data Readout and Signal Processing System at LNL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. Pedretti, M. Bellato, D. Bortolato, C. Fanin, F. Gelain, R. Isocrate, D. Marcato, E. Munaron, and S. Pavinato

RADIATION EFFECTS
Microchannel Plate Detection Efficiency to Monoenergetic Photons Between 0.66 and 20 MeV. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . R. C. Blase, R. R. Benke, K. S. Pickens, and J. H. Waite Jr.
An Efficient Methodology for On-Chip SEU Injection in Flip-Flops for Xilinx FPGAs. . . . . . . . . . . . . . . . . A. Ullah, P. Reviriego, and J. A. Maestro
Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Z. Chen, D. Ding, Y. Dong, Y. Shan, S. Zhou, Y. Hu, Y. Zheng, C. Peng, and R. Chen

RADIATION INSTRUMENTATION
Development of a Very Low-Noise Cryogenic Preamplifier for Large-Area SiPM Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. D’Incecco, C. Galbiati, G. K. Giovanetti, G. Korga, X. Li, A. Mandarano, A. Razeto, D. Sablone, and C. Savarese
Fast Scintillation X-Ray Detector Using Proportional-Mode Si-APD and a HfO2-Nanoparticle-Doped Plastic Scintillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. Inoue, M. Koshimizu, F. Hiyama, K. Asai, F. Nishikido, R. Haruki, and S. Kishimoto
Proton-Induced Radiation Damage in BaF2, LYSO, and PWO Crystal Scintillators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. Hu, F. Yang, L. Zhang R.-Y. Zhu, J. Kapustinsky, R. Nelson, and Z. Wang
6LiF:ZnS(Ag) Mixture Optimization for a Highly Efficient Ultrathin Cold Neutron Detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
     . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Osovizky, K. Pritchard, J. Ziegler, E. Binkley, Y. Yehuda-Zada, P. Tsai, A. Thompson,  C. Cooksey,  K. Siebein,  N. Hadad,  M. Jackson, C. Hurlbut, R. Ibberson, G. M. Baltic, C. F. Majkrzak, and N. C. Maliszewskyj
The Readout Controller for the Calibration System of the Muon g-2 Experiment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S. Mastroianni
Application of Silicon Drift Detectors for the Readout of a CdWO4 Scintillating Crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. D. Butt, C. Fiorini, M. Beretta, L. Gironi, S. Capelli, E. Previtali, and M. Sisti
Gamma-Ray Source Detection With Small Sensors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. Miller and A. Dubrawski
Enhanced Scintillation Light Extraction Using Nanoimprinted Photonic Crystals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. Singh,
M. S. J. Marshall, S. Waterman,    C. Pina-Hernandez,    A. Koshelev,    K. Munechika,    A. Knapitsch,    M. Salomoni,   R. Pots,  P. Lecoq,  and   V. V. Nagarkar
Development of Large-Area CdTe/n+-Si Epitaxial Layer-Based Heterojunction Diode-Type Gamma-Ray Detector Arrays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Niraula, K. Yasuda, M. Kojima, S. Kitagawa, S. Tsubota, T. Yamaguchi, J. Ozawa, and Y. Agata
Low-Power Front-End ASIC for Silicon Photomultiplier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P. Dorosz, M. Baszczyk, W. Kucewicz, and Ł. Mik

Accessibility | Privacy and Opting Out of Cookies | Nondiscrimination Policy

Copyright 2018 IEEE - All rights reserved. Use of this newsletter site signifies your agreement to the IEEE Terms and Conditions.
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity. [Response: Read Receipt]

If you would like to be removed from this email distribution, please [Response: Unsubscribe from List].
If you have unsubscribed in error, please [Response: Subscribe to List].
To unsubscribe from all mailings, use your IEEE Account to update your "Personal Profile and Communication Preferences."

Replies to this message will not reach IEEE. Due to local email service/provider settings, random characters may appear in some instances.

Although the IEEE is pleased to offer the privilege of membership to individuals and groups in the OFAC embargoed countries, the IEEE cannot offer certain services to members from such countries.

IEEE
445 Hoes Lane
Piscataway, NJ 08854 USA
+1 800 678 4333 (toll free, US & Canada)
+1 732 981 0060 (Worldwide)

For more information or questions regarding your IEEE Membership or IEEE Account, please direct your inquiries to the IEEE Contact Center.