T-NS Home | Editorial Board | T-NS in IEEE Xplore | Early Access | Manuscript Submission | ||
FEATURED STORIES - FEBRUARY 2017 | ||
"First Principles Modeling of RFQ Cooling System and Resonant Frequency Responses for Fermilab's PIP-II Injector Test"by J. P. Edelen, A. L. Edelen, D. Bowring, B. E. Chase, J. Steimel, S. G. Biedron, and S. V. MiltonIn this paper we develop an a priori method for simulating dynamic resonant frequency and temperature responses in a radio frequency quadrupole (RFQ) and its associated water-based cooling system respectively. Our model provides a computationally efficient means to evaluate the transient response of the RFQ over a large range of system parameters. The model was constructed prior to the delivery of the PIP-II Injector Test RFQ and was used to aid in the design of the water-based cooling system, data acquisition system, and resonance control system. Now that the model has been validated with experimental data, it can confidently be used to aid in the design of future RFQ resonance controllers and their associated water-based cooling systems. Without any empirical fitting, it has demonstrated the ability to predict absolute temperature and frequency changes to 11% accuracy on average, and relative changes to 7% accuracy. more... |
||
"Simplified SEE Sensitivity Screening for COTS Components in Space"by Rubén García Alía, Markus Brugger, Eamonn Daly, Salvatore Danzeca, Véronique Ferlet-Cavrois, Rémi Gaillard, Julien Mekki, Christian Poivey, and Ali ZadehWe introduce an approach aimed at prescreening COTS components according to their single-event effect (SEE) sensitivity for space missions in which a complete characterization of their individual response to protons and heavy ions is not feasible due to cost and time constraints. The method is applied to a set of SRAM memories for single-event upset (SEU) and single-event latchup (SEL) and the resulting expected SEE rates are compared with traditional approaches and in-flight data for a low-earth orbit polar and a geostationary orbit. Despite the limitations related to components with high-LET threshold and thick sensitive volumes, we conclude that the proposed method can be an efficient means of rejecting highly sensitive components or lots and performing the complete characterization only on passing devices. more... |
||
"Stabilization of Particle Discrimination Efficiencies for Neutron Spectrum Unfolding With Organic Scintillators"by Chris C. Lawrence, J. K. Polack, Michael Febbraro, J. J. Kolata, Marek Flaska, S. A. Pozzi, and F. D. BecchettiThe literature discussing pulse-shape discrimination (PSD) in organic scintillators dates back several decades. However, little has been written about PSD techniques that are optimized for neutron spectrum unfolding. Variation in n-γ misclassification rates and in γ/n ratio of incident fields can distort the neutron pulse-height response of scintillators and these distortions can in turn cause large errors in unfolded spectra. New applications in arms-control verification call for detection of lower-energy neutrons, for which PSD is particularly problematic. In this article, we propose techniques for removing distortions on pulse-height response that result from the merging of PSD distributions in the low-pulse-height region. These techniques take advantage of the repeatable shapes of PSD distributions that are governed by the counting statistics of scintillation-photon populations. We validate the proposed techniques using accelerator-based time-of-flight measurements and then demonstrate them by unfolding the Watt spectrum from measurement with a 252Cf neutron source more... |
||
A PUBLICATION OF THE IEEE NUCLEAR AND PLASMA SCIENCES SOCIETY |
||
FEBRUARY 2017 | VOLUME 64 | NUMBER 2 | IETNAE | (SSN 0018-9499) | ||
PART I OF TWO PARTS
| ||
REGULAR PAPERS |
Accessibility | Privacy and Opting Out of Cookies | Nondiscrimination Policy
Copyright 2016 IEEE - All rights reserved. Use of this newsletter site signifies your agreement to the IEEE Terms and Conditions.
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity. [Response: Read Receipt]
If you would like to be removed from this email distribution, please [Response: Unsubscribe from List].
If you have unsubscribed in error, please [Response: Subscribe to List].
To unsubscribe from all mailings, use your IEEE Account to update your "Personal Profile and Communication Preferences."
Replies to this message will not reach IEEE. Due to local email service/provider settings, random characters may appear in some instances.
Although the IEEE is pleased to offer the privilege of membership to individuals and groups in the OFAC embargoed countries, the IEEE cannot offer certain services to members from such countries.
IEEE
445 Hoes Lane
Piscataway, NJ 08854 USA
+1 800 678 4333 (toll free, US & Canada)
+1 732 981 0060 (Worldwide)
For more information or questions regarding your IEEE Membership or IEEE Account, please direct your inquiries to the IEEE Contact Center.