EDITORIAL
Comments by the Editors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . D. Fleetwood, D. Brown, S. Girard, S. Gerardin, H. Quinn, H. Barnaby, D. Kobayashi, and I. S. Esqueda
List of Reviewers
CAMERA DESIGN AND IMAGING PERFORMANCE
Measurement and Analysis of Multiple Output Transient Propagation in BJT Analog Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . N. J-H. Roche, A. Khachatrian, J. H. Warner, S. P. Buchner, D. McMorrow, and D. A. Clymer
Spatial Mapping of Pristine and Irradiated AlGaN/GaN HEMTs With UV Single-Photon Absorption Single-Event Transient
Technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . A. Khachatrian, N. J-H. Roche, S. P. Buchner, A. D. Koehler, J. D. Greenlee, T. J. Anderson, J. H. Warner, and D. McMorrow
Analysis of Soft Error Rates in 65- and 28-nm FD-SOI Processes Depending on BOX Region Thickness and Body Bias by
Monte-Carlo Based Simulations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. Zhang, S. Umehara, J. Yamaguchi, J. Furuta, and K. Kobayashi
Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . V. Gupta, A. Bosser, G. Tsiligiannis, A. Zadeh, A. Javanainen, A. Virtanen, H. Puchner, F. Saigné, F. Wrobel, and L. Dilillo
Physical TCAD Model for Proton Radiation Effects in SiGe HBTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. O. Petrosyants and M. V. Kozhukhov
Radiation Tolerance of Programmable Voltage Supply and High Galvanic Insulation Readout Electronics Used by CERN's LHC
Cryogenics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. Casas-Cubillos, N. Trikoupis, and J. Mekki
Multiscale Modeling of Accumulation of Radiation Defects in Silicon Detectors Under Alpha Particle Irradiation . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. Yu. Romashka, A. V. Yanilkin, A. I. Titov, D. V. Gusin, A. V. Sidelev, and D. Yu. Mokeev
Optical Frequency Domain Reflectometer Distributed Sensing Using Microstructured Pure Silica Optical Fibers Under Radiations . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S. Rizzolo, A. Boukenter, T. Allanche,
. . . . . . . J. Périsse, G. Bouwmans, H. El Hamzaoui, L. Bigot, Y. Ouerdane, M. Cannas, M. Bouazaoui, J.-R. Macé, S. Bauer, and S. Girard
Dose Rate Effect Comparison on the Radiation Response of Type I Fiber Bragg Gratings Written With UV cw Laser . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Morana, E. Marin, S. Girard, C. Marcandella, P. Paillet, A. Boukenter, and Y. Ouerdane
On-Line Characterization of Gamma Radiation Effects on Single-Ended Raman Based Distributed Fiber Optic Sensor . . . . . . . . C. Cangialosi,
. . . . . . . . . . . . . S. Girard, M. Cannas, A. Boukenter, E. Marin, S. Agnello, S. Delepine-Lesoille, C. Marcandella, P. Paillet, and Y. Ouerdane
Radiation Response of Ce-Codoped Germanosilicate and Phosphosilicate Optical Fibers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . D. Di Francesca, S. Girard, S. Agnello, A. Alessi, C. Marcandella, P. Paillet, N. Richard, A. Boukenter, Y. Ouerdane, and F. M. Gelardi
Dose Rate Switching Technique on ELDRS-Free Bipolar Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. Boch, A. Michez,
. . . . . . . . . . . . . . M. Rousselet, S. Dhombres, A. D. Touboul, J.-R. Vaillé, L. Dusseau, E. Lorfèvre, N. Chatry, N. Sukhaseum, and F. Saigné
Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . J. A. Clemente, F. J. Franco, F. Villa, M. Baylac, P. Ramos, V. Vargas, H. Mecha, J. A. Agapito, and R. Velazco
A Radiation-Hardened Non-Redundant Flip-Flop, Stacked Leveling Critical Charge Flip-Flop in a 65 nm Thin BOX FD-SOI Process . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. Furuta, J. Yamaguchi, and Kazutoshi Kobayashi
Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . J. A. Clemente, F. J. Franco, F. Villa, M. Baylac, S. Rey, H. Mecha, J. A. Agapito, H. Puchner, G. Hubert, and R. Velazco
Total Ionizing Dose Effects in Hydrogen Sensors Based on MISFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. I. Podlepetsky
CHARM: A Mixed Field Facility at CERN for Radiation Tests in Ground, Atmospheric, Space and Accelerator Representative . . . . . . . . . . . . . .
Environments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. Mekki, M. Brugger, R. G. Alia, A. Thornton, N. C. Dos Santos Mota, and S. Danzeca
Proton-Induced Single-Event Degradation in SDRAMs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . A. Rodriguez, F. Wrobel, A. Samaras, F. Bezerra, B. Vandevelde, R. Ecoffet, A. Touboul, N. Chatry, L. Dilillo, and F. Saigné
Methodologies for the Statistical Analysis of Memory Response to Radiation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. L. Bosser, V. Gupta,
. . . . . . . . . . . G. Tsiligiannis, C. D. Frost, A. Zadeh, J. Jaatinen, A. Javanainen, H. Puchner, F. Saigné, A. Virtanen, F. Wrobel, and L. Dilillo
Combine Flash-Based FPGA TID and Long-Term Retention Reliabilities Through VT Shift . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . J.-J. Wang, N. Rezzak, D. Dsilva, F. Xue, S. Samiee, P. Singaraju, J. Jia, V. Nguyen, F. Hawley, and E. Hamdy
Flexible Ag-ChG Radiation Sensors: Limit of Detection and Dynamic Range Optimization Through Physical Design Tuning . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A. Mahmud, Y. Gonzalez-Velo, M. Saremi, H. J. Barnaby,
. . . . . . . . . . . M. N. Kozicki, K. E. Holbert, M. Mitkova, T. L. Alford, M. Goryll, W. Yu, D. Mahalanabis, W. Chen, N. Chamele, and J. Taggart
Radiation Hardening by Process of CBRAM Resistance Switching Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . .Y. Gonzalez-Velo, A. Mahmud, W. Chen, J. L. Taggart, H. J. Barnaby, M. N. Kozicki, M. Ailavajhala, K. E. Holbert, and M. Mitkova
ISNP/GNEIS Facility in Gatchina for Neutron Testing With Atmospheric-Like Spectrum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . O. A. Shcherbakov, A. S. Vorobyev, A. M. Gagarski, L. A. Vaishnene, E. M. Ivanov, V. S. Anashin, L. R. Bakirov, and A. E. Koziukov
Impact of the Border Crossing Effects on the DCNU for Pixel Arrays Irradiated With High Energy Protons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. C. Ursule, C. Inguimbert, and T. Nuns
Embedded Detection and Correction of SEU Bursts in SRAM Memories Used as Radiation Detectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . R. Secondo, G. Foucard, S. Danzeca, R. Losito, P. Peronnard, A. Masi, M. Brugger, and L. Dusseau
New Insight Into Heavy Ion Induced SEGR: Impact of Charge Yield . . . . . . . . . . . . . . . . . . . V. V. Emeliyanov, A. S. Vatuev, and R. G. Useinov
Dark Current Spectroscopy on Alpha Irradiated Pinned Photodiode CMOS Image Sensors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J.-M. Belloir, V. Goiffon, C. Virmontois, P. Paillet, M. Raine, P. Magnan, and O. Gilard
Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . P. Ramos, V. Vargas, M. Baylac, F. Villa, S. Rey, J. A. Clemente, N.-E. Zergainoh, J.-F. Méhaut, and R. Velazco
Predictions of Proton Cross-Section and Sensitive Thickness for Analog Single-Event Transients . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. Weulersse, S. Morand, F. Miller, T. Carrière, and R. Mangeret
Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E. Chielle, F. Rosa, G. S. Rodrigues, L. A. Tambara, J. Tonfat,
. . . . . E. Macchione, F. Aguirre, N. Added, N. Medina, V. Aguiar, M. A. G. Silveira, L. Ost, R. Reis, S. Cuenca-Asensi, and F. L. Kastensmidt
Analyzing the Impact of Radiation-Induced Failures in Programmable SoCs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . L. A. Tambara, P. Rech, E. Chielle, J. Tonfat, and F. L. Kastensmidt
Reliability Analysis of Operating Systems and Software Stack for Embedded Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T. Santini, L. Carro, F. Rech Wagner, and P. Rech
Partial TMR in FPGAs Using Approximate Logic Circuits . . . . . . . . . . . . . . . . . . . A. J. Sánchez-Clemente, L. Entrena, and M. García-Valderas
A Soft-Error Mitigated Microprocessor With Software Controlled Error Reporting and Recovery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. Farnsworth, L. T. Clark, A. R. Gogulamudi, V. Vashishtha, and A. Gujja
Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. S. Gorbunov, A. B. Boruzdina, and P. S. Dolotov
Conference Author Index
PART II OF TWO PARTS
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REGULAR PAPERS
Optically Stimulated Luminescence Analysis Method for High Dose Rate Using an Optical Fiber Type Dosimeter . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. Ueno, K. Tominaga, T. Tadokoro, K. Ishizawa, Y. Takahashi, and H. Kuwabara
Trigger Efficiency of a ZnS:6LiF Scintillation Neutron Detector Readout With a SiPM . . . . . . . . . . . . A. Stoykov, J.-B. Mosset, and M. Hildebrandt
The Effect of Low-Temperature Annealing on a CdZnTe Detecto . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. H. Kim, S. Hwang, P. Fochuk, L. Nasi, A. Zappettini, A. E. Bolotnikov, and R. B. James
Measurement of Neutron Energy Distributions From p+Be Reaction at 20 MeV Using Threshold Activation Foils . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . V. Suman, S. P. Tripathy, C. Sunil, A. A. Shanbhag, S. Paul, G. S. Sahoo, T. Bandyopadhyay, and P. K. Sarkar
A 2D Proof of Principle Towards a 3D Digital SiPM in HV CMOS With Low Output Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . F. Nolet, V.-P. Rhéaume, S. Parent, S. A. Charlebois, R. Fontaine, and J.-F. Pratte
Design and Performance of the BCM1F Front End ASIC for the Beam Condition Monitoring System at the CMS Experiment . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. Przyborowski, J. Kaplon, and P. Rymaszewski
Ultra-Fast Sampling and Data Acquisition Using the DRS4 Waveform Digitizer . . . . . . . . . . . . . . . . . . . . . M. Bitossi, R. Paoletti, and D. Tescaro
Compaction in Optical Fibres and Fibre Bragg Gratings Under Nuclear Reactor High Neutron and Gamma Fluence . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . L. Remy, G. Cheymol, A. Gusarov, A. Morana, E. Marin, and S. Girard
Study of the Influence of Heat Sources on the Out-of-Pile Calibration Curve of Calorimetric Cells Used for Nuclear Energy Deposition
Quantification . . . . . . . . . . . . C. De Vita, J. Brun, C. Reynard-Carette, M. Carette, H. Amharrak, A. Lyoussi, D. Fourmentel, and J.-F. Villard
Determination of Bandwidths of PWR-UO2 Spent Fuel Radionuclide Inventory Based on Real Operational History Data . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I. Fast, Y. Aksyutina, H. Tietze-Jaensch, and D. Bosbach
Design and Construction of Large Size Micromegas Chambers for the ATLAS Upgrade of the Muon Spectrometer . . . . . . . . . . . . . F. Jeanneau
Decentralized Fuzzy MPC on Spatial Power Control of a Large PHWR . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . X. Liu, D. Jiang, and K. Y. Lee
Predictive Trip Detection for Nuclear Power Plants . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. J. Rankin and J. Jiang
A Quantitative Analysis of DICE SRAM SEU Caused by Heavy Ion Elastic Scattering . . . . . . . . M. Zhu, H. Zhu, W. Zhang, Q. Yu, and M. Tang
Ionizing Energy Depositions After Fast Neutron Interactions in Silicon . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. Bergmann, S. Pospisil, I. Caicedo, J. Kierstead, H. Takai, and E. Frojdh
CMOS Rad-Hard Front-End Electronics for Precise Sensors Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S. Sordo-Ibáññez, B. Piñero-García, M. Muñoz-Díaz, A. Ragel-Morales, J. Ceballos-Cáceres,
. . . . . . . . . . . . . . L. Carranza-González, S. Espejo-Meana, A. Arias-Drake, J. Ramos-Martos, J. M. Mora-Gutiérrez, and M. A. Lagos-Florido
Influence of Alternate Biasing on TID Effects of Irradiated Mixed-Signal Programmable Arrays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T. R. Balen, R. G. Vaz, G. S. Fernandes, and O. L. Gonçalez
Studying the Variation Effects of Radiation Hardened Quatro SRAM Bit-Cell . . . . . . . . . . . . L. D. Trang Dang, M. Kang, J. Kim, and I.-J. Chang
Single-Event Transient Characterization of a Radiation-Tolerant Charge-Pump Phase-Locked Loop Fabricated in 130 nm PD-SOI
Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Z. Chen, M. Lin, Y. Zheng, Z. Wei, S. Huang, and S. Zou
Proton Recoil Telescope Based on Diamond Detectors for the Measurement of Fusion Neutrons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B. Caiffi, M. Osipenko, M. Ripani, M. Pillon, and M. Taiuti
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